XJP-158J Metallurgical microscope
XJP-158J Metallurgical microscope is developed and aimed at the
semiconductor industry, wafer manufacturing, electronic information
industry, metallurgical industry, Used as an advanced Metallurgical
microscope, the user can experience its super performance when
using it. It can be widely used to identify and analyze
Semiconductor, FPD, Circuit encapsulation, circuit substrate,
Material, Casting/Metal/Ceramic parts, Precision moulds. This
instrument adopts both reflecting and transmitted illumination,
Bright＆Dark field, DIC and Polarizing observation
can proceed under reflecting illumination, and the Bright field
observation is done under transmitted light. High quality and
reliable optical system brings much clearer and sharper image. The
design meets with the ergonomics needs and makes you feel
comfortable and relaxed in doing your job
Characteristics and description
1. Adopt UIS High-resolution, long working distance, and infinity
light path
correcting system objective imaging technology
2. Extending the multiplexing technology of objective, compatible
infinity
objective with all the observation methods, including bright＆dark
field
observation, polarization and DIC also provide with high clear and
sharp
image in each observation method.
3. Aspherical surface Kohler illumination, increasing the viewing
brightness.
4. WF10×(Φ25)Super wide viewing field Eyepiece, long working
distance
metallurgical objective with bright and dark field
5. The Nosepiece can be equipped with detachable DIC differential
interference
device.
| Specification |
| Viewing Head | Compensation Free Trinocular Head, Inclined 30°(50mm-75mm) |
| Eyepiece | WF10×/25mm |
| WF10×/20mm,crosshair with reticule 0.1mm |
| Objective | Long working distance bright＆dark field Infinity.Plan Objectives: 5×/0.1B.D/W.D.29.4mm,10×/0.25B.D/W.D.16mm, 20×/0.40B.D/W.D.10.6mm,40×/0.60B.D/W.D.5.4mm, |
| Nosepiece | With DIC Jack Quadruple Nosepiece |
| Stage | Double layer mechanical stage |
| Stage Size: 189mm×160mm |
| Moving Range:80mm×50mm |
| Filter | Flashboard type Filters (green,blue,neutral) |
| Condenser | N.A.1.25 Abbe Condenser with iris diaphragm and filter |
| Focusing | Coaxial coarse ＆fine focusing adjustment with rack and pinion
mechanism.Fine focusing scale value 0.002mm |
| Light Source | Transmission Illumination: Halogen Bulb 12V/50W,AC85V-230V,
Brightness Adjustable |
Epi-illumination:With aperture iris diaphragm and field iris
diaphragm, halogen Bulb 12V/50W,AC85V-230V, Brightness Adjustable |
| Polarizing Device | Analyzer 360°rotatable,both Polarizer and Analyzer can be moved out
of the light path |
| Checking Tool | 0.01mm Micrometer |
| Optional Accessory | Two-dimensional measure software |
| Professional metallurgical image analysis software |
| Epi-illumination:Halogen Bulb 12V/100W,AC85V-230V, Brightness
Adjustable |
Long working distance bright ＆ dark field Infinite Planobjectives: 50×/0.55B.D/W.D.5.1mm,80×/0.75B.D/W.D.4mm,100×/0.80B.D/W.D.3mm |
| micrometer eyepiece |
| 1.3Mega,2.0 Mega,3.0 Mega,5.0 Mega pixels CMOS Digital camera
eyepieces |
| Photography attachmentand CCD Adapter 0.5×,0.57×,0.75× |
| DIC(10×,20×,40×,100×) |
| Planishing tool |
| CCD Camera,colour 1/3″High resolution 520 TV lines |
